Cart (Loading....) | Create Account
Close category search window

Transverse magnetooptic effects in Ni-Fe films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rubinstein, Harvey ; Sylvania Electronic Systems, Waltham, Mass. ; Mac Donald, M.

This paper describes measurements of the transverse Kerr effect in Ni-Fe films. These measurements were made in the study of the magnetooptic effects over the wavelength range 0.3 to 3 μ. The quantity measured was the relative reflectivity which is the ratio of a change in reflectance due to the variation of the transverse magnetization divided by the Fresnel reflectivity. Data are presented which show the variation of this quantity as a function of the composition of iron-nickel alloys and for given alloys as a function of wavelength. These data show that in the 0.3- to 3-μ wavelength range relative reflectivities betweenpm 3.5 times 10^{-3}have been obtained.

Published in:

Magnetics, IEEE Transactions on  (Volume:4 ,  Issue: 3 )

Date of Publication:

Sep 1968

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.