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Transverse magnetooptic effects in Ni-Fe films

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2 Author(s)
Rubinstein, Harvey ; Sylvania Electronic Systems, Waltham, Mass. ; Mac Donald, M.

This paper describes measurements of the transverse Kerr effect in Ni-Fe films. These measurements were made in the study of the magnetooptic effects over the wavelength range 0.3 to 3 μ. The quantity measured was the relative reflectivity which is the ratio of a change in reflectance due to the variation of the transverse magnetization divided by the Fresnel reflectivity. Data are presented which show the variation of this quantity as a function of the composition of iron-nickel alloys and for given alloys as a function of wavelength. These data show that in the 0.3- to 3-μ wavelength range relative reflectivities betweenpm 3.5 times 10^{-3}have been obtained.

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Magnetics, IEEE Transactions on  (Volume:4 ,  Issue: 3 )