Anomalously fast flux reversal has been observed in films made of Ni-Fe layers separated by SiO. The speed of reversal increases as the number of identical layers of Ni-Fe increases. For a 5-layer film, the anomalous speed is observed in films with the SiO thickness as great as 1600 Å. Reversal time curves presented as a family of curves of1/tau = f(h_{perp})with hsas a parameter have two regions. The high-drive region has a lower slope in the laminated films when compared to the single-layer films. For this family of curves, a switching coefficientS_{w'}can be defined, as the inverse slope, in a manner similar to the definition of Swfor1/tau = f(h_{s})withh_{perp}as a parameter. For films with from two to five layers, Sw' is constant at1 times 10^{-3} mus and is smaller by an order of magnitude for the single-layer films. A dual loop experiment is used to confirm that coherent rotation is not a dominant mechanism. It is concluded that a model must satisfy the following criteria to successfully describe flux reversal in the laminated films: It must provide rapid flux reversal for fields less than Hk, an insensitivity to transverse fields either constant or pulsed, and an interaction that can survive over a wide range of SiO thicknesses.
Published in:
Magnetics, IEEE Transactions on
(Volume:2
,
Issue:
3
)
Date of Publication:
Sep 1966
- Page(s):
-
557
-
559
- ISSN :
-
0018-9464
- Digital Object Identifier :
-
10.1109/TMAG.1966.1065923
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
06 January 2003
- Issue Date :
-
Sep 1966
- Sponsored by :
-
IEEE Magnetics Society