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R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.