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Domain studies of CoCr with perpendicular anisotropy

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4 Author(s)
Lodder, J.C. ; University of Twente, Enschede, The Netherlands ; Wind, D. ; Popma, T.J.A. ; Hubert, A.

R.F. Magnetron sputtered CoCr films (79/21 at%) with various thicknesses are magnetically characterized. The domain structure is observed by digitally enhanced Kerr microscopy and depends on the Hc/Hk values of the samples. For low and high coercivity films a comparison is made between the measured VSM hysteresis, domain period and a theoretical domain model. The domain shape is a function of the magnetic history of the sample and the bending created by the deposition process.

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Magnetics, IEEE Transactions on  (Volume:23 ,  Issue: 5 )