Cart (Loading....) | Create Account
Close category search window
 

Indirectly coupled films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Bruyere, J.C. ; Laboratoire d''Electrostatique et de Physique du Métal, C.N.R.S., Grenoble, France ; Clerc, G. ; Massenet, O. ; Paccard, D.
more authors

A positive coupling has been observed between magnetic films separated by a thin metallic layer. Five methods which have been developed for measuring this coupling and the variation of the coupling with evaporation temperature, measuring temperature, and thickness of the intermediate layer are described. Three mechanisms are proposed for the observed coupling : bulk diffusion of ferromagnetic atoms into the intermediate layer, diffusion of magnetic atoms along grain boundaries, and polarization of conduction electrons. The effect of this coupling on slow switching, pulse switching, and creep is discussed.

Published in:

Magnetics, IEEE Transactions on  (Volume:1 ,  Issue: 3 )

Date of Publication:

Sep 1965

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.