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Built-in self-test (BIST) structure for analog circuit fault diagnosis

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1 Author(s)
Chin-Long Wey ; Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA

An analog built-in self-test (BIST) structure for analog circuit fault diagnosis is described that increases the numbers of test points while still keeping low pin overhead. The BIST structure allows access to some internal nodes so that the fault diagnosis process can be significantly simplified. The BIST structure also allows designers to use one channel of an oscilloscope to simultaneously monitor multiple output waveforms of analog circuits or systems

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Instrumentation and Measurement, IEEE Transactions on  (Volume:39 ,  Issue: 3 )