Referenced Items are not available for this document.
An analog built-in self-test (BIST) structure for analog circuit fault diagnosis is described that increases the numbers of test points while still keeping low pin overhead. The BIST structure allows access to some internal nodes so that the fault diagnosis process can be significantly simplified. The BIST structure also allows designers to use one channel of an oscilloscope to simultaneously monitor multiple output waveforms of analog circuits or systems
Published in:
Instrumentation and Measurement, IEEE Transactions on
(Volume:39
,
Issue:
3
)
Date of Publication: Jun 1990
- Page(s):
- 517 - 521
- ISSN :
- 0018-9456
- INSPEC Accession Number:
- 3711089
- Digital Object Identifier :
- 10.1109/19.106284
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Jun 1990
- Sponsored by :
- IEEE Instrumentation and Measurement Society
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