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A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO)

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4 Author(s)
Bleichner, H. ; Inst. of Technol., Uppsala Univ., Sweden ; Nordlander, E. ; Rosling, M. ; Berg, S.

The measurement of two-dimensional (2-D) excess-carrier distribution in a gate GTO by a time-resolved infrared-absorption technique is discussed. The optical scanning system employs a wide memory digital oscilloscope for data acquisition and a computer system for control, data processing, and display. Maps of the carrier distribution in the active GTO device are produced under steady-state conditions as well as during turn-on and turn-off operation. The maps are presented as three-dimensional (3-D) views produced from 2-D measurements

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Instrumentation and Measurement, IEEE Transactions on  (Volume:39 ,  Issue: 3 )