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Measurement of surface topography of magnetic recording materials through computer analyzed microscopic interferometry

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3 Author(s)
Perry, D. ; 3M Center, Saint Paul, Minnesota, USA. ; Robinson, G. ; Peterson, R.

A recently developed surface characterization technique, Computer Analyzed Microscopic Interferometry, is shown to have many applications in the study of magnetic recording surfaces. Three-dimensional and quantitative interferometric images produce very high depth resolution without reducing the field of view. This allows very precise surface roughness and volume measurements.

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Magnetics, IEEE Transactions on  (Volume:19 ,  Issue: 5 )