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Signal-to-noise ratio studies on γ-Fe2O3thin film recording disks

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4 Author(s)
A. Terada ; Ibaraki Electrical Communication Laboratory, Tokai, Ibaraki, Japan ; O. Ishii ; S. Ohta ; T. Nakagawa

The signal-to-noise ratio SNRwof γ-Fe2O3thin film disks has been investigated in a linear bit density range of 77-1500 flux reversals per millimeter (FRPM), for several media whose average crystallite sizes were changed by Ti doping. The noise voltage was found to increase as the bit-cell length became shorter, and as the average crystallite size became larger. A SNRwrelationship to the average crystallite size, the resolution, and the bit-cell length was empirically determined as a simple formula. For a 10-μm core width and for a 1.0-μm bit-cell length, an SNRwof more than 35 dB was estimated to be attainable from the medium which had a 0.90 resolution and had crystallites averaging less than 0.06 μm in size.

Published in:

IEEE Transactions on Magnetics  (Volume:19 ,  Issue: 1 )