Cart (Loading....) | Create Account
Close category search window

Submicron bubble garnets and their characterizations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ohta, N. ; Central Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo, Japan ; Ikeda, T. ; Ishida, F. ; Sugita, Y.

New Submicron (0.5-1.0 mum diam) bubble garnets have been developed. In order to reduce saturation induction4piMsas low as possible, suitable choice of amounts of nonmagnetic ions substituting for ferric ions in both tetrahedral and octahedral sites were studied in (YSm)3(FeAl)5O12, (YSmLu)3- (FeGaSc)5O12, (YSmLu)3(FeAlSc)5O12and (LaLuSm)3- (FeGa)5O12garnet systems. For example, in (YSmLu)3- (FeAlSc)5O12a film with the following properties was grown; strip widthw = 0.7mum, film thicknessh= 0.7mum, quality factorq=2.8, Curie temperatureTc= 140degC and4piMs=770G. The temperature properties of those films could be improved drastically by doping with a small amount of Gd ion. Wall mobilities μw of those films are in the region from 200 to 500cm/s/Oe. Preceding these material studies, several film characterization methods have been investigated. Film thickness was measured by Fluorescent X-ray method, strip width by using a highly sensitivity TV camera, and bubble collapse field by FMR resonance technique respectively.

Published in:

Magnetics, IEEE Transactions on  (Volume:16 ,  Issue: 5 )

Date of Publication:

Sep 1980

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.