By Topic

An approach estimating the number of domain walls and eddy current losses in grain-oriented 3% Si-Fe tape wound cores

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sakaki, Y. ; Chiba University, Yayoi-Cho, Chiba, Japan

A method is presented for estimating the number of domain walls in grain-oriented 3% Si-Fe tape wound cores under sinusoidal flux conditions by extending the method developed in a study of the dynamic behavior of 50% Ni-Fe square-loop cores. The results show that the number of domain walls increases approximately with exciting frequency asf^{0.4 sim 0.5}. The calculated eddy current loss based on the modified Pry and Bean equation and the obtained number of domain walls agree well with the measured loss.

Published in:

Magnetics, IEEE Transactions on  (Volume:16 ,  Issue: 4 )