By Topic

Mechanisms for critical-current degradation in NbTi and Nb3Sn multifilamentary wires

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ekin, J.W. ; National Bureau of Standards, Boulder, Colorado

Critical currents of NbTi and Nb3Sn multifilamentary wires have been studied in magnetic fields to 9 T as a function of mechanical load applied at 4 K. Degradation of the critical current in NbTi is limited to about 30% with the effect becoming large only at strains above ∼ 1%. The change in critical current with strain is much larger in Nb3Sn, commencing at strains of 0.1 to 0.3%. For both superconductors, the first 20 to 30% decrease in critical current is almost totally reversible. A number of possible explanations of the observed degradation are considered, including filament breakage, heat generation by mechanical creep, degradation of the stabilizing matrix, and defect formation in the superconductor itself. Results of experiments to test the source of degradation are reported. Evidence for microcrack damage in the Nb3Sn reaction layer has been found and it is suggested that defect size variations on the order of a coherence length (∼ 5 nm) can account for the reversibility of the degradation as well as low-strain enhancement effects.

Published in:

Magnetics, IEEE Transactions on  (Volume:13 ,  Issue: 1 )