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Diagnostic testing of a 10-kbit bubble memory chip

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5 Author(s)
Orihara, S. ; Fujitsu Laboratories, Ltd., Kawasaki, Japan ; Iwasa, S. ; Majima, Teiji ; Nogiwa, K.
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A 10-kbit bubble memory chip has been designed and fabricated. Testing was accomplished using a new diagnostic test system, which can drive the bubble chip at two different speeds with bias fields switched synchronously with the bubble propagation. Bias margins of the fabricated chips were analyzed and it was confirmed that a sufficient bias-margin window could be assured in long-term operation.

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Magnetics, IEEE Transactions on  (Volume:11 ,  Issue: 6 )