IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Information Theory, IEEE Tran ...> Volume:33 Issue:6 Help

Locating the maximum of a simple random sequence by sequential search

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hajek, B.

Consider a stationary Gaussian process withEX_{i}X_{j}=a^{|i-j|}where0 < a < 1,nd let0 < r < 1. It is shown that to locate the maximum ofX_{l}, X_{2}, cdots, X_{N}for largeNwith probabilityr, roughly-rN log a/loglog Nobservations at sequentially determined locations are both sufficient and necessary.

Published in:
Information Theory, IEEE Transactions on  (Volume:33 ,  Issue: 6 )

Date of Publication: Nov 1987

Page(s):
877 - 881
ISSN :
0018-9448
Digital Object Identifier :
10.1109/TIT.1987.1057378
Product Type:
Journals & Magazines
Date of Current Version :
06 January 2003
Issue Date :
Nov 1987
Sponsored by :
IEEE Information Theory Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.