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Design of universal test sequences for VLSI

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2 Author(s)

A test sequence is called (s,t) -universal if it exercises every function depending on t or fewer inputs on a very large scale integration (VLSI) chip with s inputs. Randomized and deterministic procedures are deseribed for the design of (s,t) -universal sequences and for the signature analysis of the test outputs.

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Information Theory, IEEE Transactions on  (Volume:31 ,  Issue: 1 )