By Topic

On the capacity of computer memory with defects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A computer memory with defects is modeled as a discrete memoryless channel with states that are statistically determined. The storage capacity is found when complete defect information is given to the encoder or to the decoder, and when the defect information is given completely to the decoder but only partially to the encoder. Achievable storage rates are established when partial defect information is provided at varying rates to both the encoder and the decoder. Arimoto-Blahut type algorithms are used to compute the storage capacity.

Published in:

Information Theory, IEEE Transactions on  (Volume:29 ,  Issue: 5 )