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Switching-time statistics for a ramp-excited tunnel diode switch (Corresp.)

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2 Author(s)

An analytical model is developed which yields switching-time jitter statistics for a tunnel diode excited by a current ramp. For appropriate wide-band noise, a "switch sensitivity period" is defined over which a weighted average (a stochastic integral)of the noise specifies the deviation in the switching time. The predictions agree with experimental results.

Published in:

IEEE Transactions on Information Theory  (Volume:23 ,  Issue: 3 )