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Advanced automatic test pattern generation techniques for path delay faults

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3 Author(s)
Schulz, M.H. ; Dept. of Electr. Eng., Tech. Univ. of Munich, West Germany ; Fuchs, K. ; Fink, F.

Based on the sophisticated techniques applied in the automatic test pattern generation system SOCRATES, the authors present the extension of SOCRATES to test generation for path delay faults. In particular, they propose a ten-valued logic and describe the corresponding implication and path sensitization procedures in detail. After discussing an extended multiple backtrace procedure, which has been developed specifically to meet the requirements of path delay testing, they conclude with a number of experimental results.<>

Published in:

Fault-Tolerant Computing, 1989. FTCS-19. Digest of Papers., Nineteenth International Symposium on

Date of Conference:

21-23 June 1989