By Topic

Error intervals and cluster density in channel modeling (Corresp.)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

This correspondence is concerned with binary processes and presents results with immediate applications in the modeling of digital channels for the purpose of evaluating code performance. It is demonstrated that cluster density can be analytically described from the distributions of intervals between errors. These relations and derived clustering properties hold for any stationary process. Analyses of real error data exemplify the use of these results in regard to channels having dependent inter-error intervals.

Published in:

IEEE Transactions on Information Theory  (Volume:20 ,  Issue: 1 )