Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. For technical support, please contact us at We apologize for any inconvenience.
By Topic

A distribution-free sequential probability-ratio test for multiple-resolution-element radars (Corresp.)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A distribution-free procedure applicable to the detection of a signal in some element of a multiple-resolution-element radar is described. The procedure is based on rank-order statistics and is applicable to either a sequential or fixed-sample-size test; however, emphasis is placed on the sequential procedure. Results are given showing the expected sample size and probability of detection for the case of envelope detection (square-law or linear) of a fluctuating signal (Swerling model 2). A comparison is made with the optimum parametric sequential procedure.

Published in:

Information Theory, IEEE Transactions on  (Volume:14 ,  Issue: 6 )