Cart (Loading....) | Create Account
Close category search window
 

Sequential recognition using a nonparametric ranking procedure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

In the problems of statistical pattern recognition, it has become increasingly known that there are many applications in which parametric assumptions regarding the pattern statistics are not justified. This paper treats a nonparametric design of a sequential recognition machine which uses the optimum property of Wald's sequential probability ratio test (SPRT). For the case of binary classification, a sequential ranking procedure is found useful in a two-sample problem in which we wish to test the hypothesis against the Lehmann alternatives, based on the successively ranked observations. The test procedure is then analyzed in terms of the performance criterion which in this case is the expected number of observations, with specified error probabilities. A generalization procedure of multiple classification is also given as a direct extension. Computer-simulated experiments have illustrated the effectiveness of this test procedure in the recognition of handwritten English characters, where the nonparametric method seems to be necessary and appropriate.

Published in:

Information Theory, IEEE Transactions on  (Volume:13 ,  Issue: 3 )

Date of Publication:

July 1967

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.