Cart (Loading....) | Create Account
Close category search window
 

A surface-charge random-access memory system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

The authors present a surface-charge storage cell suitable for word-organized dynamic random-access memory and discuss its operation in a memory system. Experimental results and computer simulations of the readout process on a 4/spl times/8 array using this cell are given. A sensitive stable sense-and-refresh amplifier, suitable for use with this memory cell is also described. Simulations of a 4096-bit chip with a storage cell density of 2.5 mils/SUP 2//bit using this refresh amplifier predict a cycle time of 250 ns.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:7 ,  Issue: 5 )

Date of Publication:

Oct. 1972

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.