Cart (Loading....) | Create Account
Close category search window
 

A sensitivity analysis of SPICE parameters using an eleven-stage ring oscillator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

SPICE is a circuit simulator which predicts node voltages and currents as a function of time from device model parameters. Model parameters are determined by the manufacturing process, but process-induced variations in these parameters occur within a chip or from chip to chip. Values for the model parameters used in simulators are usually obtained from measurements on test structures along the periphery of the circuit or in test chips located at several sites on the product wafer. This paper presents examples of how well model parameters extracted from a test chip can predict the AC response of a dynamic circuit element (MOS ring oscillator) on the same wafer. Simulation results show which model parameters are critical to performance. A comparison between measurement and simulation results is given and the importance of intrachip and intrawafer parameter variations is discussed. For the samples tested, the polysilicon gate linewidth variation was determined to be the primary cause of the ring oscillator frequency variation.

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:19 ,  Issue: 1 )

Date of Publication:

Feb. 1984

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.