By Topic

The per-unit-length capacitance matrix of flaring VLSI packaging interconnections

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Omer, A.A. ; Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA ; Cangellaris, A.C. ; Mechaik, M.M. ; Prince, J.

A three-dimensional capacitance calculator was used for the accurate calculation of the per-unit-length (PUL) capacitance matrix of flaring, multiple, coupled microstrip, and stripline interconnections. Properly constructed Green's functions that satisfy the boundary conditions at dielectric interfaces were implemented in order to minimize the number of unknowns involved in the numerical solution. Under the assumption that the longitudinal components of the electric and magnetic fields are negligible compared to the transverse ones, the PUL inductance matrix was found from the inverse of the capacitance matrix calculated from the same conductor geometry in a uniform dielectric medium

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:14 ,  Issue: 4 )