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Describes a high speed and high density dynamic RAM utilizing a static induction transistor (SIT) structure. The main conduction mechanism of an SIT is carrier injection control due to the potential hump at the intrinsic gate, where the potential hump is capacitively controlled by the gate and the drain voltage in a basic operation. The SIT forms a dynamic RAM memory cell if one of the drain and the source regions is set as a floating region directly connected to the storage capacitor. Basic operation of a single SIT memory cell is experimentally demonstrated in this paper.