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In this paper, we introduce a new method for ellipse detection. This method takes the advantages of major axis of an ellipse to find ellipse parameter fast and efficiently. It only needs a one-dimensional accumulator array to accumulate the length information for minor axis of the ellipse. This method does not require the evaluation of the tangents or curvatures of the edge contours, which are generally very sensitive to noisy working conditions. No complicated mathematical computation is involved in the implementation and the required computational storage space is much cheaper compared to the current methods. Experiments with both synthetic and real images indicate the effectiveness of the proposed method.
Pattern Recognition, 2002. Proceedings. 16th International Conference on (Volume:2 )
Date of Conference: 2002