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Improving defect detection in static-voltage testing

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3 Author(s)
M. Renovell ; Microelectron. Dept., Lab. d'Informatique Robotique Microelectronique de Montpellier, France ; F. Azais ; Y. Bertrand

Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.

Published in:

IEEE Design & Test of Computers  (Volume:19 ,  Issue: 6 )