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Interaction factors of multi-layered magnetic thin film system

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2 Author(s)
M. Guo ; Dept. of Electr. Eng., Washington Univ., St. Louis, MO, USA ; R. S. Indeck

Magnetostatic interaction factors of coupled magnetic thin films are proposed to assist the analysis of the electric and magnetic properties of such systems. The factors, fy and fz, which are diagonal elements of an interaction tensor, are proportional to the interaction energies due to the magnetization in y and z directions. Three-dimensional mathematical expressions of these factors are developed. The interaction energy of the system in each film can be determined numerically using these factors. As a result, the magnetoresistive character of the system can be obtained numerically. The interaction factor decreases rapidly as the distance is increased, with the rate of decrease being faster for thinner films. The numerical solution of the output character of a coupled thin-film read head agrees with previous experimental findings

Published in:

IEEE Transactions on Magnetics  (Volume:26 ,  Issue: 5 )