Close category search window
 

Current-mode digital gates and circuits: concept, design and verification

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Maslennikow, O. ; Tech. Univ. of Koszalin, Poland ; Pawlowski, P. ; Soltan, P. ; Berezowski, R.

The paper deals with the problem of design and FPGA-based realization of digital circuits with current-mode gates: novel digital gates operating with constant, continuous power supply current. The purpose is the provision of a high level of noise immunity of chips, which contain both analog and digital circuits. Using the proposed approach to design digital current-mode circuits, current-mode prototypes of several digital circuits and similar to the Spartan II slice are designed. The obtained circuits are characterized by smaller hardware overheads and switching noise levels in comparison with the similar circuits based on the classical voltage type gates. This indicates the possibility of realization of field programmable mixed analog-digital array on a single die.

Published in:
Electronics, Circuits and Systems, 2002. 9th International Conference on  (Volume:2 )

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.