Close category search window
 

Developing, validating and evolving an approach to product line benefit and risk assessment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Schmid, K. ; Fraunhofer Inst. for Exp. Software Eng., Kaiserslautern, Germany ; John, I.

Product line engineering is usually a very beneficial, but sometimes also a very risky endeavor, as there is no guarantee for economic success. In this paper, we describe an assessment approach that is designed to address the problem of quantifying reuse risks by providing an efficient means for determining the benefits and risks associated with a specific product line development. In particular, the approach supports decomposition and individual assessment of the technical domains of the product line, thus also furthering the incremental introduction of product lines. At the core of this paper is the development of the underlying assessment technology and how this approach was evolved over time based on multiple case studies. This evolution approach is rather general. Thus, we see the potential of applying these techniques also for evolving other assessment approaches.

Published in:
Euromicro Conference, 2002. Proceedings. 28th

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.