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Total dose bias dependency and ELDRS effects in bipolar linear devices

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6 Author(s)
Yui, C.C. ; Jet Propulsion Lab., Electron. Parts Eng. Office, Pasadena, CA, USA ; McClure, S.S. ; Rax, B.G. ; Lehman, J.M.
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Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited enhanced low dose rate sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrates results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

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Radiation Effects Data Workshop, 2002 IEEE

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