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Current single event effects and radiation damage results for candidate spacecraft electronics

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26 Author(s)
O'Bryan, M.V. ; Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA ; LaBel, K.A. ; Ladbury, R.L. ; Poivey, C.
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We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.

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Radiation Effects Data Workshop, 2002 IEEE

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