By Topic

Adaptive scenario-based object-oriented test frameworks for testing embedded systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
W. T. Tsai ; Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA ; Y. Na ; R. Paul ; F. Lu
more authors

This paper presents a process to develop adaptive object-oriented scenario-based test frameworks for testing embedded systems. Embedded systems often require rigorous testing due to the mission-critical nature of their applications, and they are often developed as a family of products. The process uses techniques such as design-for-change, design patterns, scenarios, ripple effect analysis, and regression testing. This paper then uses an example to illustrate this process by applying it to test a mobile phone system, and the framework constructed can facilitate generation of numerous test cases quickly with minimum effort, and it can also accommodate many changes suggested by another party without changing the overall structure of the framework

Published in:

Computer Software and Applications Conference, 2002. COMPSAC 2002. Proceedings. 26th Annual International

Date of Conference: