Close category search window
 

Model estimation for photometric changes of outdoor planar color surfaces caused by changes in illumination and viewpoint

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mindru, F. ; Katholieke Univ., Leuven, Belgium ; Van Gool, L. ; Moons, T.

We compare different ways of representing the global photometric changes in image intensities caused by changes in illumination and viewpoint, aiming at a balance between goodness-of-fit and low complexity. A series of model selection tests are performed for the case of outdoor imagery consisting of several views of several instances of billboards taken under different viewing angles and different illumination (natural light). Possible candidates for a transformation model on (R,G,B) color space are investigated and different approaches for the model selection problem are considered. The results are used within ongoing research into computation of new invariant features for planar color patterns, as the model choice is an important issue to decide on when extracting invariants. These results can be of benefit to other areas of research into color pattern or object recognition.

Published in:
Pattern Recognition, 2002. Proceedings. 16th International Conference on  (Volume:1 )

Date of Conference: 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.