Cart (Loading....) | Create Account
Close category search window
 

High-resolution electron microscopy: from imaging toward measuring

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Van Aert, S. ; Dept. of Appl. Phys., Delft Univ. of Technol., Netherlands ; den Dekker, A.J. ; van den Bos, A. ; Van Dyck, D.

High-resolution electron microscopy is discussed as a measuring, rather than an imaging, technique. It is shown that the interpretation or the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:51 ,  Issue: 4 )

Date of Publication:

Aug 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.