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Very thin CoCr films on titanium underlayers for high-density perpendicular recording computer discs

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3 Author(s)
Mapps, D.J. ; Dept. of Electr. & Electron. Eng., Plymouth, UK ; Akhter, M.A. ; Pan, G.

Very thin CoCr films with and without a Ti underlayer were deposited on strengthened glass disk substrates by bias RF-sputtering. Perpendicular M-H loops were successfully measured by a polar Kerr M-O loop plotter. Very pronounced effects of the Ti underlayer and bias on the shearing of the loop and the perpendicular remanence ratio were observed. X-ray diffraction results show excellent (002) orientation of CoCr films with Ti underlayers. Experimental results are discussed in the light of the particulate model and the stripe domain model

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Magnetics, IEEE Transactions on  (Volume:26 ,  Issue: 5 )