By Topic

Instrumenting embedded test software in support system integration, factory production, and depot repair

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
J. R. Vash ; Raytheon Syst. Co., McKinney, TX, USA

Embedded built-in test (BIT) software typically provides a system-level go/no-go indication and, in the presence of a failure, may provide some level of sub-system isolation. This level of reporting, while meeting the customer's operational requirements, does little to support system integration, production, and repair. To support these other needs, "instrumentation code" is added to the BIT software to provide detailed test data through an external interface. Since the BIT software already accesses the hardware parameters for testing, it becomes the most logical component for the instrumentation. This paper describes the techniques of embedding instrumentation during BIT design and development to support a broad range of program test needs. It explains the costs and benefits associated with the use of instrumentation. It gives specific examples of instrumented software and describes how instrumentation data can be used during environmental tests, factory test, and depot test. The impact instrumentation has on software development time, code size, execution time, and reliability is discussed as well as the cost of retrofitting BIT software to add instrumentation. Some of the benefits as well as the challenges to developing effective embedded instrumentation is also examined.

Published in:

IEEE Aerospace and Electronic Systems Magazine  (Volume:17 ,  Issue: 10 )