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A hierarchical test methodology for systems on chip

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9 Author(s)
Jin-Fu Li ; Nat. Central Univ., Chung-li, Taiwan ; Hsin-Jung Huang ; Jeng-Bin Chen ; Chih-Pin Su
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We present a hierarchical test methodology for testing a SOC with heterogeneous cores, including the 1149.1-wrapped, P1500-wrapped, and BIST memory cores. We propose an 1149.1-based hierarchical test manager that also provides P1500 test control signals. This scheme includes a memory BIST interface, providing both serial and parallel access ports for BIST circuits. Our approach offers low area and pin overhead, and high flexibility

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IEEE Micro  (Volume:22 ,  Issue: 5 )