Referenced Items are not available for this document.
Experimental devices using patterns of holes etched into semiconductor surfaces are under evaluation for use as neutron detectors. The devices have miniature holes equidistantly spaced so as to completely cover the front surface of a planar semiconductor device. The devices have both electrical contacts and neutron-reactive coatings applied over the surface and within the holes. The tiny holes assist in thin-film adhesion while offering a method to increase the thermal-neutron detection efficiency.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:49
,
Issue:
4
)
Date of Publication: Aug 2002
- Page(s):
- 1999 - 2004
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 7443262
- Digital Object Identifier :
- 10.1109/TNS.2002.801697
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 10 December 2002
- Issue Date :
- Aug 2002
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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