Cart (Loading....) | Create Account
Close category search window
 

Digital rise-time discrimination of large-area avalanche photodiode signals in X-ray detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fernandes, L.M.P. ; Dept. de Fisica, Coimbra Univ., Portugal ; Simoes, P.C.P.S. ; Santos, F.P. ; Morgado, R.E.

The response of a large-area avalanche photodiode to X-rays was investigated by applying pulse-shape discrimination techniques based on rise time. The method employed analog preshaping with time constants of 200 ns followed by digital signal processing in a commercial 125-MHz digitizer. Pulse rise-time discrimination was applied to improve detector energy resolution, background level, and peak distortion. Electronic noise pulses can be efficiently removed at the expense of data-acquisition throughput.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 4 )

Date of Publication:

Aug 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.