Step-edge magnetoresistance of magnetite films

The magnetoresistance induced by step edges in magnetite films was investigated. The films were fabricated on MgAl/sub 2/O/sub 4/ substrates patterned by ion-beam etching prior to film deposition. If the crystallographic quality of the magnetite film is good enough, a clear magnetoresistance anisotropy is observed with respect to the relative direction of current and step edge.