By Topic

Local degradation of magnetic properties in magnetic thin films irradiated by Ga+ focused-ion-beams

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chang-Min Park ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Bain, J.A.

The magnetic properties of NiFe and FeCoN thin films were examined using Kerr microscopy after Ga+ focused-ion-beam (FIB) irradiation. Magneto-optic characterizations of 30 μm × 30 μm irradiated surface areas showed that the magnetization was reduced in approximately linear proportion to the Ga+ ion dose. Above an ion dose of approximately 0.6 nC/μm2 (3.8 × 1017 ions/cm2), little sign of the Kerr rotation could be found. The effect of the irradiation on the coercive force was also examined. Little effect of the beam on the coercivity of NiFe was seen, but an increase of coercivity was seen in FeCoN. The reduction of the Kerr rotation is attributed to magnetic moment loss caused by Ga implantation into the magnetic thin films. This loss has been quantified and is relevant to pole trimming for high-density magnetic recording heads.

Published in:

Magnetics, IEEE Transactions on  (Volume:38 ,  Issue: 5 )