Cart (Loading....) | Create Account
Close category search window
 

Performance analysis of beyond 100 Gb/in2 MFM-based MEMS-actuated mass storage devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
El-Sayed, R.T. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; Carley, L.R.

This paper presents an initial performance analysis of microelectromechanical systems (MEMS)-actuated mass storage devices that employ a magnetic force microscopy (MFM)-based approach for writing and reading. Extensive micromagnetic modeling and simulations have been performed to optimize both the tip dimensions and read/write flying heights in terms of signal-to-noise ratio, inter-track interference (ITI), and thermal decay rate. Using a commercial, single-layered 14-nm grain diameter Co-based granular media, this initial optimization process indicates the possibility of achieving a track pitch of 59 nm and a bit length (with conservative RL coding) of 100 nm (i.e., areal density of 105 Gb/in2). The resulting SNR is 13.1 dB (RMS signal/RMS noise) with -3 dB/10 year thermal decay rate.

Published in:

Magnetics, IEEE Transactions on  (Volume:38 ,  Issue: 5 )

Date of Publication:

Sep 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.