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Testing cross-talk induced delay faults in static CMOS circuit through dynamic timing analysis

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2 Author(s)
B. C. Paul ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; K. Roy

In deep submicron (DSM) circuits the critical path obtained from static timing analysis may often be incorrect due to the significant effect of crosstalk. In this paper we present a new algorithm based on timed automatic test pattern generation (ATPG) to generate a list of critical paths of a circuit and the corresponding input vectors to sensitize these paths under cross-talk. The algorithm based on modified PODEM handles multiple aggressors to a victim node and properly activates the aggressors to obtain maximum coupling to the victim. Several circuits were tested using this algorithm and results were verified by HSPICE simulation.

Published in:

Test Conference, 2002. Proceedings. International

Date of Conference:

2002