Cart (Loading....) | Create Account
Close category search window
 

The effects of field errors on low-gain free-electron lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Esarey, E. ; US Naval Res. Lab., Washington, DC, USA ; Tang, C.M. ; Marable, W.P.

The effects of random wiggler magnetic field errors on low-gain free-electron lasers (FELs) are examined analytically and numerically through the use of ensemble averaging techniques. Wiggler field errors perturb the electron beam as it propagates and lead to a random walk of the beam centroid, variations in the axial beam energy, and deviations in the relative phase of the electrons in the ponderomotive wave. The random walk of the beam centroid and the consequent variations in the axial beam energy are discussed. The deviations in the relative phase resulting from the field errors are examined. The effect of the field errors on the FEL gain in the low-gain regime is determined. The benefits of beam steering are analyzed, and addition methods for reducing the detrimental effects of field errors are discussed

Published in:

Quantum Electronics, IEEE Journal of  (Volume:27 ,  Issue: 12 )

Date of Publication:

Dec 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.