By Topic

Better reliability assessment and prediction through data clustering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
J. Tian ; Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA

This paper presents a new approach to software reliability modeling by grouping data into clusters of homogeneous failure intensities. This series of data clusters associated with different time segments can be directly used as a piecewise linear model for reliability assessment and problem identification, which can produce meaningful results early in the testing process. The dual model fits traditional software reliability growth models (SRGMs) to these grouped data to provide long-term reliability assessments and predictions. These models were evaluated in the testing of two large software systems from IBM. Compared with existing SRGMs fitted to raw data, our models are generally more stable over time and produce more consistent and accurate reliability assessments and predictions.

Published in:

IEEE Transactions on Software Engineering  (Volume:28 ,  Issue: 10 )