Cart (Loading....) | Create Account
Close category search window
 

Detection of photoabsorption point with capillary imaging gas proportional counter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Sakurai, H. ; Dept. of Phys., Yamagata Univ., Japan ; Gunji, S. ; Tokanai, F. ; Inoue, Y.
more authors

We have successfully detected the images of photoelectron tracks of 2.7and 5.9-keV X-rays utilizing a capillary imaging gas proportional counter (CIGC). The images of the photoelectron tracks were extracted by systematic analysis based on clustering of the tracks, eliminating the spurious noise cluster due to an image-intensified charge-coupled device camera. The characteristics of the images were investigated in terms of the relationship between the light yield and the area of the cluster. The extent of cluster spreading was approximately 1.3 mm on average for 2.7-keV photoelectrons. The light yield of the clusters for 5.9-keV X-rays was distributed at 74% full-width at half-maximum around a peak that is approximately two times larger than that for 2.7-keV photoelectrons. The area of the clusters for 5.9-keV X-rays was approximately 1.5 times larger than that for 2.7-keV photoelectrons. The results imply that the photoabsorption point is detectable for X-rays above 10 keV.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 3 )

Date of Publication:

Jun 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.