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Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

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4 Author(s)
Manghisoni, M. ; Dipt. di Ingegneria, Universita di Bergamo, Dalmine, Italy ; Ratti, L. ; Re, V. ; Speziali, V.

High-density high-speed CMOS and BiCMOS technologies are today widely used for the design of readout integrated circuits for room-temperature X- and γ-ray imaging detectors. This paper describes a laboratory instrument that was developed to characterize the noise performances of CMOS devices to be used for high-speed analog signal processing. This instrument extends the noise-measuring capabilities beyond 100 MHz to detect the white noise component beyond the 1/f noise corner frequency, which in shorter channel devices shifts to higher values as compared to long-channel transistors.

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Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 3 )