Cart (Loading....) | Create Account
Close category search window
 

Modular multichannel acquisition system for high-resolution X-ray spectroscopy detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Guazzoni, C. ; Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy ; Buzzetti, Siro ; Longoni, Antonio ; Arnaboldi, C.

We present a modular multichannel acquisition system for high-resolution X-ray spectroscopy detectors. The system has been developed for the acquisition of signals coming from 12-element Si drift detectors but can be easily used for the acquisition of signals coming from other kinds of detectors. The main characteristics of the system are flexibility and low cost. The basic component of our acquisition system is a board that acquires the signal coming from a shaping amplifier and provides peak stretching, peak detection, and analog-to-digital conversion. The converted data are transferred to the PC using the protocol of a bidirectional enhanced parallel port. The acquisition system has been fully developed and tested. The obtained overall linearity is within + / - 0.4%. The achieved energy resolution is fully comparable to that achieved with a commercial multichannel analyzer system equipped with a 13-bit analog-to-digital converter. The system has been extensively used to acquire signals coming from single- and multi-element silicon drift detectors.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:49 ,  Issue: 3 )

Date of Publication:

Jun 2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.