Cart (Loading....) | Create Account
Close category search window
 

Invariant feature extraction based on radial and distance function for automatic target recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sun-Gu Sun ; Dept. of Electr. Eng., Korea Adv. Energy Res. Inst., Daejeon, South Korea ; HyunWook Park

Proposes an invariant feature set for recognizing nonoccluded military vehicles in natural FLIR (forward-looking infrared) images. The proposed feature set is extracted from global and local shape information to improve recognition performance. After segmenting a target, a radial function is defined from a target boundary to extract global shape features. Also, to extract local shape features of upper region of a target, a distance function is defined, which designates distance between boundary points of upper region and a line drawn by two extreme points. From two functions and target boundary, four global and four local shape features are extracted. They are more invariant to similarity transform than traditional feature sets. In the experiments, we show that the proposed features are superior to the traditional feature sets with respect to invariance and recognition performance.

Published in:

Image Processing. 2002. Proceedings. 2002 International Conference on  (Volume:3 )

Date of Conference:

2002

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.